Simulation of pixel-size impact for optical brightfield wafer defect inspection
Introduction
These days, we do not get by a day without technology. Yet, we hardly stop to think about the very foundations that allow our way of life: semiconductors. Notably so, as the early computers took up a huge room, and yet today, we hold them in our palms, and fork out hundreds or thousands of dollars to buy them.
Background
Methods
Results
Conclusions
Appendix
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